Oxford Instruments Benchtop AFM (Glovebox)

This Oxford Instruments benchtop atomic force microscope is installed inside a glovebox for protected-atmosphere characterization of air-sensitive two-dimensional materials and heterostructures. It supports surface inspection, thickness and roughness measurements, and nanoscale topography without ambient exposure.

Oxford Instruments Asylum Research documents glovebox AFM operation for two-dimensional materials, including high-resolution imaging and moire characterization.